Begell House作者，编辑及审稿者

V. V. Orlov

National Research Nuclear University MEPhI, 31 Kashirskoye Highway, Moscow, 115409, Russia
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Articles

SIMULATION OF THE INTERDEVICE LEAKAGE CURRENT UNDERNEATH THICK ISOLATION OXIDES IN CMOS FPGAS Vol. 21 '2017 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes