Begell House作者，编辑及审稿者

A. P. Yarygin

Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation
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Articles

Functional Failures and Noise Arising under the Effect of Powerful Ultrashort Pulses on Mobile Phones and Radio Transmitters Vol. 62 '2004 - Telecommunications and Radio Engineering
Interference Effects of a Powerful Pulsed Microwave Field on Microphone Devices Vol. 66 '2007 - Telecommunications and Radio Engineering
STATISTICAL MODELS OF THE CRITERION LEVELS OF SEMICONDUCTOR DEVICES ELECTROMAGNETIC KILL Vol. 71 '2012 - Telecommunications and Radio Engineering