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Progress in Plasma Processing of Materials, 1999

ISBN:
1-56700-126-2 (Print)

OPTICAL DIAGNOSTICS AND PROCESS CONTROL IN PLASMA SPRAYING

R. Hernberg
Tampere University of Technology, Department of Physics, Plasma Technology Laboratory, P.O.Box 692, FIN-33101 Tampere, Finland

J. Vattulainen
Tampere University of Technology, Department of Physics, Plasma Technology Laboratory, P.O.Box 692, FIN-33101 Tampere, Finland

T. Korhonen
Tampere University of Technology - Department of Physics - Plasma Technology Laboratory P.O. Box 692 - FIN-33 101 Tampere - Finland

J. Knuuttila
Tampere University of Technology, Department of Physics, Plasma Technology Laboratory, P.O.Box 692, FIN-33101 Tampere, Finland

T. Mantyla
Tampere University of Technology, Department of Physics, Plasma Technology Laboratory, P.O.Box 692, FIN-33101 Tampere, Finland

Abstract

The potential for Passive Imaging Spray Diagnostics (PISM) based on the application of CCD cameras for the monitoring of industrial thermal spray processes is discussed. Some properties and results of a prototype system for PISM are presented.