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ISSN: 0040-2508 Print
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DOI: 10.1615/TelecomRadEng.v66.i19
Pages: 96
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DOI: 10.1615/TelecomRadEng.v66.i19.80
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Article price - $35.00 |
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Influence of Pulse Electromagnetic Fields on Current-Technology Microcontrollers
M. P. Gribskii
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine
Ye. V. Grigor'ev
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine
A. K. Voitovich
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine
S. A. Zuev
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine
V. V. Starostenko
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine
G. I. Churyumov
Kharkov National University of Radio Engineering and Electronics, 14, Lenin Ave, Kharkov, 61166; Tavriya National University, 4, Vernadskogo ave., Simpheropol, 95007, Ukraine
ABSTRACT
The results of the experimental investigation of degradation processes in microcontrollers under impact of the pulse electromagnetic fields are analyzed and represented. The dominant causes of their malfunctions are determined. Threshold values of the field when operation failures occur and degradation processes begin, have been obtained. The least stable of all elements of chips as well as the causes and the nature of catastrophic failures have been studied.
pages 1791-1797
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