Telecommunications and Radio Engineering

ISSN for PRINT: 0040-2508

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2003, Volume60

S. Yu. Karelin
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085, Ukraine

The setup for measuring parameters of semiconductor compounds by means of the electron paramagnetic resonance method and measurement results of Cd_1−xMn_xTe-semimagnetic semiconductor parameters with the manganese concentration x varying from 0.1 to 0.45, have been represented.

DOI: 10.1615/TelecomRadEng.v60.i56.140 Download article, 10 pages

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