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Telecommunications and Radio Engineering

ISSN for PRINT: 0040-2508

Institutional price:	$4518.00
Issues per year:	20

Best Paper Award Selection - Editorial Board Site

2003, Volume60

161 pages

DOI: 10.1615/TelecomRadEng.v60.i56

Issue price - $394.00

Accuracy and Sensitivity of Surface Resistance Measurements of High-Temperature Superconductor Films Using Quasioptical Dielectric Resonators

A. A. Barannik
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkov 61085, Ukraine

S. A. Bunyaev
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkov 61085, Ukraine

N. T. Cherpak
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkov 61085, Ukraine

ABSTRACT

The most probable measurement error analysis of the surface resistance R_s of high-temperature superconductor (HTS) films using quasioptical dielectric resonators has been carried out depending on the resonator main operating characteristics and dielectric properties. It has been shown that using the quasioptical dielectric resonator made of single crystal leukosapphire one can achieve the extremely low values of the measurement error and the most high measurement sensitivity of the surface resistance R_s at low temperatures. Numerical evaluations are presented for the 8-mm wavelength range. In partially, the minimal measurable value R_s^min (R_s^min < 1 μΩ at T < 4.2 K) based on the sapphire single crystal properties and operating characteristics of modern microwave network-analyzers has been obtained.