Telecommunications and Radio Engineering

ISSN for PRINT: 0040-2508

For Online Access

Best Paper Award Selection - Editorial Board Site

2005, Volume63

Issue 2-6

467 pages

DOI: 10.1615/TelecomRadEng.v63.i2

Issue price - $985.00

Ye. F. Korneyev

A. M. Tsyrlov

The microchips (IC) for electric devices offer a number of nonstandard parameters. This requires that special flexible techniques for testing these parameters should be employed in the course of a manufacturing process. In the present paper the IC structural features allowing the testability of these microcircuits are examined, and the PC-based measuring complex is described.

DOI: 10.1615/TelecomRadEng.v63.i6.130 Download article, 561-567 pages

Article price - $35.00

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