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ISSN for PRINT: 0040-2508
Institutional price: |
$4518.00 |
Issues per year: |
20 |
 2008, Volume67
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94 pages |
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Issue price - $271.00
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Method of Identifying Failure Places in Digital Devices Based on CMOS Elements
Ivan S.
Zakharov
Kursk State Technical University 94, 50-let Oktyabrya Street, Kursk, 305040, Russia
V. M.
Kosukhin
A. N.
Zbinyakov
The Academy of Federal Security Guard Service of the Russian Federation, Orel, Russia
ABSTRACT
A method and an implementing device for simplifying and facilitating the process of quality control of assemblies of digital CMOS devices are proposed.
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Article price - $35.00 |
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