Shopping cart ITEMS
 modern scholarly publishers in the finest tradition
Login Register
Home
Books
Journals
References
A-Z Index
Author Index
For Our Authors
User Area
Shopping Cart
Contact
Electronic Data Center

High Temperature Material Processes (An International Quarterly of High-Technology Plasma Processes)

An International Journal 

ISSN for PRINT: 1093-3611

Institutional price:

$604.00

Issues per year:

4

For Online Access

Best Paper Award Selection - Editorial Board Site

Add subscription to shopping cart

2002, Volume6

Issue 4

  125 pages  

   

click 'Save as...' here to save XML metadata

Issue price - $144.00  

Add to shopping cart

  • INFLUENCE OF LIGHT CONTAMINANTS ON PROPERTIES OF AN ION BEAM EMITTED FROM LASER-PRODUCED HIGH-Z PLASMA
  • J. Wolowski
    Institute of Plasma Physics and Laser Microfusion, 23 Eery St (23), 00-908 Warsaw, Poland

    J. Badziak
    Institute of Plasma Physics and Laser Microfusion, 23 Eery St (23), 00-908 Warsaw, Poland

    P. Parys
    Institute of Plasma Physics and Laser Micro fusion, 23 Eery St (23), 00-908 Warsaw, Poland

    E. Woryna
    Institute of Plasma Physics and Laser Micro fusion, 23 Eery St (23), 00-908 Warsaw, Poland

    J. Krasa
    Joint Research Laboratory PALS of the Institute of Plasma Physics, Academy of Science of the Czech Republic, Za Slovankom 3, 182 21 Prague 8, Czech Republik

    L. Laska
    Joint Research Laboratory PALS of the Institute of Plasma Physics, Academy of Science of the Czech Republic, Za Slovankom 3, 182 21 Prague 8, Czech Republik

    K. Rohlena
    Joint Research Laboratory PALS of the Institute of Physics and Institute of Plasma Physics, Acad. Sci. CR, Za Slovankou 3,182 21 Praha 8, Czech Republic

    L. Ando
    INFN-Laboratori Nazionale del Sud, Catania, Italy

    S. Gammino
    INFN-Laboratori Nazionale del Sud, Via S.Sofia 44, 95123, Catania, Italy


    ABSTRACT

    The results of investigation of light contaminant ions emission from tungsten target, irradiated with a medium laser intensity (∼5 × 1011 W/cm2) are presented. The ion measurements were based on the time-of-flight method and were performed with the use of ion collectors and an electrostatic ion-energy analyzer. Ion collector signals show two groups of ions (thermal and fast ions) the existence of which corresponds to different ion species. The faster ion group contains only light contaminants, mainly H+, С+, О+, С2+, and О2+. The slower ion group contains W ions only. The 1st laser shot on a fresh target surface generates a large amount of contaminant ions and it should be treated as a laser cleaning shot It was estimated that a number of successive laser shots onto the target under our experimental conditions does not essentially change the properties of the ion beam.

    Download article, 6 pages

    Article price - $35.00  

    Add to shopping cart

    << Previous article   Next article >>

    Designed by offsiteteam Designed by offsiteteam Designed by offsiteteam
    Begell House Inc.
    50 Cross Highway,
    Redding, CT 06896
    TEL (203) 938 1300
    FAX (203) 938 1304
    orders@begellhouse.com