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Atomization and Sprays

Journal of the International Institutes for Liquid Atomization and Spray Systems

ISSN for PRINT: 1045-5110

Institutional price:	$787.00
Issues per year:	8

Best Paper Award Selection - Editorial Board Site

1995, Volume5

121 pages

Issue price - $75.00

DENSE SPRAY CORRECTIONS FOR DIFFRACTION-BASED PARTICLE SIZE DISTRIBUTION MEASUREMENTS

Christine M. Woodall
Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801

James E. Peters
Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

Richard O. Buckius
Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, 158 Mechanical Engineering Building, MC-244, 1206 West Green Street, Urbana-Champaign, IL 61801, USA

ABSTRACT

The effect of dense sprays on particle size measurement by laser-diffraction-based techniques is examined for log-normal distributions with a wide range of Sauter mean diameters and size distribution widths. A Monte Carlo modeling technique is used to simulate scattering of light by particles, and general scattering phenomena are included by using Mie theory. By regression analysis, corrections for the SMD and size distribution width are obtained and presented in graphical and equation form. The corrections depend on the actual Sauter mean diameter and the actual width parameter of the spray and the obscuration. Simulations are also performed for a limited number of Rosin-Rammler distributions, and the results for the log-normal and Rosin-Rammler distributions are compared. For log-normal distributions and Rosin-Rammler distributions with n greater than 2.0, increasing the Sauter mean diameter of the size distribution increases the measurement error in SMD and decreases the error in width. Increasing the size distribution width also results in an increase in the measurement error in SMD and a decrease in the width. For Rosin-Rammler distributions with n less than 2.0, these trends are the same with one important exception: as the Sauter mean diameter increases, the measurement error in SMD decreases.