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ISSN: 1044-5110 Print
ISSN: 1936-2684 Online
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Institutional price: $1443.00
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Pages: 103
| Article price - $35.00 |
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IMPROVEMENT OF PATTERN RECOGNITION ALGORITHM FOR DROP SIZE MEASUREMENT
Joo Youn Kim
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1, Kusong-Dong, Yusong-Gu, Taejon, 305-701 Korea
Jeong Ho Chu
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1, Kusong-Dong, Yusong-Gu, Taejon, 305-701 Korea
Sang Yong Lee
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1, Kusong-Dong, Yusong-Gu, Taejon, 305-701 Korea
ABSTRACT
In the present work, the pattern recognition algorithm for drop size measurement has been improved by focusing on the processing of the partially detected or overlapped drop images and the oval-shaped drop images. The improved algorithm was assessed by using an artificially prepared image frame, where the overlapped and the oval-shaped particles are mixed with the normal spherical ones (with their true size distributions known a priori). The results show that both the number of particles recognized and the measurement accuracy are improved significantly.
pages 313-329
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