Begell Houseの著者、編集者及びレビュー者

V. Yu. Tereshchenko

Tavricheskii National University, 4, Vernadskogo Ave., Simferopol, 95007, Ukraine
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Articles

An Influence of Heat Processes on the Drift Characteristics of Semiconductor Structures Vol. 59 '2003 - Telecommunications and Radio Engineering
Avalanche Features in Silicon Schottky-FETs in Accordance with Numerical Simulation Results Vol. 65 '2006 - Telecommunications and Radio Engineering
Influence of Heterogeneity of the Active Region of the MESFET on the Criterial Wunsch-Bell Dependence Vol. 67 '2008 - Telecommunications and Radio Engineering
Numerical Simulation of Avalanche Breakdown in the GaAs MESFET Vol. 67 '2008 - Telecommunications and Radio Engineering