Авторы, Редакторы, Рецензенты

Michael L. Alles

Vanderbilt University, Nashville, TN 37237, USA
Больше информации об авторе - в Directory of Specialists

Articles

Multiscale Simulation Models for Transient Radiation Effects with 3D Ionizing Tracks in Semiconductor Nanodevices Vol. 7 '2009 - International Journal for Multiscale Computational Engineering