Авторы, Редакторы, Рецензенты

Yiou Li

Department of Applied Mathematics, Illinois Institute of Technology, Chicago, Illinois, 60616, USA
Больше информации об авторе - в Directory of Specialists

Articles

ORTHOGONAL BASES FOR POLYNOMIAL REGRESSION WITH DERIVATIVE INFORMATION IN UNCERTAINTY QUANTIFICATION Vol. 1 '2011 - International Journal for Uncertainty Quantification