Begell House作者，编辑及审稿者

Andrei Tyavlovsky

Belarussian National Technical University, Minsk, Republic of Belarus
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Articles

INFLUENCE OF RAPID THERMAL TREATMENT OF INITIAL SILICON WAFERS ON THE ELECTROPHYSICAL PROPERTIES OF SILICON DIOXIDE OBTAINED BY PYROGENOUS OXIDATION Vol. 23 '2019 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes