Begell House作者，编辑及审稿者

L. Raniero

Instituto Nacional de Metrologia, Normalização e Qualidade Industrial-Divisão de Metrologia de Materiais, Av. Nossa Senhora das Graças, 50 - Prédio 3 - Dimci/Dimat, 25250-020 Xerém - Duque de Caxias - RJ
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Articles

DIFFERENCES BETWEEN AMORPHOUS AND NANOSTRUCTURED SILICON FILMS AND THEIR APPLICATION IN SOLAR CELL Vol. 11 '2007 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
SPECTRAL RESPONSE OF LARGE AREA AMORPHOUS SILICON SOLAR CELLS Vol. 8 '2004 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes