Kundenlogin 0 Einkaufswagen
Home Bücher eBücher Zeitschriften Referenzen und Berichte Autoren, Herausgeber, Rezensenten A – Z Produktindex
Progress in Plasma Processing of Materials, 1999

ISBN Druckformat: 1-56700-126-2

STUDY OF LOW TEMPERATURE PLASMA-STIMULATED GROWTH OF YSZ THIN FILMS ON Si SUBSTRATE

Abstrakt

The growth of yttria-stabilized zirconia (YSZ) films on Si by RF magnetron sputter deposition is studied. New method to control the process of film growth is proposed with use of RF bias on substrate. The structure of as-deposited films is studied as a function of experimental conditions. It has been shown that the optimal choice of RF bias parameters allows to fabricate highly ordered YSZ films with different textures at low temperatures of substrate.
Home Begell Digitales Portal Begell Digitale Bibliothek Zeitschriften Bücher eBücher Referenzen und Berichte Autoren, Herausgeber, Rezensenten A – Z Produktindex Preise und Aborichtlinien Über Begell House Kontakt Language English 中文 Русский 日本語 Português Deutsch Français Español