The home for science and engineering™
English
中文
Русский
日本語
Português
Deutsch
Français
Español
Prices and Subscription Policies
About Begell House
Contact Us
Customer Login
0
Shopping Cart
Search box
Search
Home
Books
eBooks
Journals
References and Proceedings
Authors, Editors, Reviewers
A-Z Product Index
Find Journals
Home
Begell House Authors, Editors and Reviewers
Begell House Authors, Editors and Reviewers
Menu
For Authors
For Editors
For Reviewers
Gennady I. Zebrev
National Research Nuclear University MEPhI, 31 Kashirskoye Highway, Moscow, 115409, Russia
Get more info about author from Directory of Specialists
Articles
SIMULATION OF THE INTERDEVICE LEAKAGE CURRENT UNDERNEATH THICK ISOLATION OXIDES IN CMOS FPGAS
Vol. 21 '2017
-
High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
SIMULATION OF ANNEALING AND THE ELDRS IN p-MNOS RadFETs
Vol. 23 '2019
-
High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
Home
Begell Digital Portal
Begell Digital Library
Journals
Books
eBooks
References and Proceedings
Authors, Editors, Reviewers
A-Z Product Index
Find Journals
Prices and Subscription Policies
About Begell House
Contact Us
Language
English
中文
Русский
日本語
Português
Deutsch
Français
Español