Autores, Editores y Críticos de Begell House

V. V. Orlov

National Research Nuclear University MEPhI, 31 Kashirskoye Highway, Moscow, 115409, Russia
Obtenga más información sobre el autor en el Directorio de Especialistas

Articles

SIMULATION OF THE INTERDEVICE LEAKAGE CURRENT UNDERNEATH THICK ISOLATION OXIDES IN CMOS FPGAS Vol. 21 '2017 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes