Ingreso de Usuario 0 Carrito de Compras
Inicio Libros eLibros Revistas Referencias y Libros de Ponencias Autores, Editores, Críticos Índice de Productos de la A a la Z
ICLASS 94
Proceedings of the Sixth International Conference on Liquid Atomization and Spray Systems

ISBN Imprimir: 978-1-56700-019-1

ISBN En Línea: 978-1-56700-445-5

MEASUREMENT OF LIQUID FILM THICKNESS WITHIN A Y-JET ATOMIZER

Sinopsis

This paper describes an innovative method for measuring the mean and the local film thickness within the mixing duct of a Y-jet atomizer. The method is based on impedance measurements between two suitably shaped electrodes, immersed in a dielectric test atomizer. The data obtained by means of this technique have been compared with the results of an experimental characterisation of the spray structure by Phase Doppler Particle Analyser. A simple model allowed to evaluate the film flowrate from the measured value of film thickness. Information on liquid film characteristics is of paramount importance in determining optimal operating conditions and design criteria for Y-jet atomizers.
Inicio Portal Digitalde Begell Biblioteca Digital Begell Revistas Libros eLibros Referencias y Libros de Ponencias Autores, Editores, Críticos Índice de Productos de la A a la Z Precios y Políticas de Suscripcione Sobre Begell House Contáctenos Language English 中文 Русский 日本語 Português Deutsch Français Español