Авторы, Редакторы, Рецензенты

Maxim G. Drosdetsky

National Research Nuclear University MEPhI, 31 Kashirskoye Highway, Moscow, 115409, Russia
Больше информации об авторе - в Directory of Specialists

Articles

SIMULATION OF THE INTERDEVICE LEAKAGE CURRENT UNDERNEATH THICK ISOLATION OXIDES IN CMOS FPGAS Vol. 21 '2017 - High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes